Accurate CT Scanner

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Invention This invention provides the method to develop X-ray computed tomography (CT) scanners without artifact. The breakthroughs include the novel architecture and method, which have been developed based on wide dynamic range (WDR) CMOS imaging sensor techniques. The new synchronous partial quantization architecture can partially quantize the photocurrent with a constant potential well in the pixel. Only a low resolution single-slope ADC is needed to quantize the residual voltage. As a result, the detector can sense wide dynamic range with high linearity. The new CMOS CT scanner can achieve distortion lower than 0.1%, while the scanner noise is lower than the X-ray quantum noise. Thus, the CT equipment is artifact-free after the image reconstruction. Further, all these features can be achieved on a single CMOS chip. The CMOS imaging sensor based architecture is also highly scalable to larger 2D arrays. The 2D array scanner has high fill factor.   Market Opportunity Computed tomography (CT) requires high speed WDR scanner with high linearity. However, existing CT equipment using CCD devices with scintillator to sense the incident X-ray is not only expensive, but also complex. Although CMOS CT scanners have recently been developed to replay hybrid detection, they are limited by their low linearity. In light of the lack of solution in the market, this invention provides an alternative which can sense wide dynamic range with high linearity.   Key Benefits Novel architecture Good scalability Applicable for wide dynamic range High linearity