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This instrument is a type of microscope that can probe the size and surface property information of nanoparticles.
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Descriptions The combination of particle size characterization with surface electrochemical characteristics of nanometer-sized particles into a single analytical method. Rapid and reproducible analysis is possible utilizing dark field scattering spectroelectrochemistry. This instrument is a type of microscope that can probe the size and surface property information of nanoparticles. The instrument casts a beam of light through a darkfield condenser, then focuses it onto an indium tin oxide stage to which a desired voltage isapplied. The light passes through the stage and is collected by a CCD camera; simultaneously current data is also measured of the illuminated section. Technology Details: https://youtu.be/IArkCOMU05k Patent Status: PATENT Pending